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Delcam to launch PowerINSPECT 2013 with free seminar

PowerINSPECT offers dual-column and dual-device inspection

Delcam will launch the 2013 version of its PowerINSPECT inspection software with a free half-day seminar at its Birmingham headquarters on 23rd April.  The morning event will include demonstrations of the new options in the 2013 release, and tips and tricks showing how to get the best results out of the software, plus a presentation from Hexagon on the latest developments in its range of portable metrology devices.

The meeting is open both to existing PowerINSPECT users that want to see the latest version of the software and to companies that are considering the use of PowerINSPECT for their inspection and reverse engineering needs.  To book a place, please go to

The 2013 release of PowerINSPECT offers unique dual-device inspection options that allow measurement with two portable devices at the same time.  This is an extension of the functionality for dual-column CMMs included in the 2012 R2 release.  PowerINSPECT is believed to be the only inspection software that supports simultaneous operation of different types of device, including laser scanning equipment, from different manufacturers.

Other enhancements in the new version include improved handling of point-cloud data, group editing of probing parameters, graphical editing of boundaries for raster-based inspection, more flexibility in programming dual-column CMMs, and easier measurement and marking out when using PowerINSPECT for clay modelling.

PowerINSPECT is firmly established as the world’s leading hardware-independent inspection software.  It combines the ability to work with all types of inspection device with a comprehensive range of inspection routines for taking simple measurements, for inspection of geometric features and for analysing complex 3D surfaces.  The resulting reports present detailed information in an easy-to-read format, that can be understood by all engineers not just inspection specialists.

25 March 2013

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