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  • Delcam to launch new PowerINSPECT in China at CIMT seminar

Delcam to launch new PowerINSPECT in China at CIMT seminar


PowerINSPECT offers dual-column and dual-device inspection

Delcam will launch the 2013 version of its PowerINSPECT inspection software in China with a free half-day seminar on 25th April during the CIMT exhibition in Beijing.  The afternoon event will include demonstrations of the new options in the 2013 release, plus presentations from Ben Brereton, PowerINSPECT Development Manager, Phil Hewitt, PowerINSPECT Marketing Product Manager and Joe Zhou, Business Development Manager for Greater China.

Places at the seminar can be booked on the Delcam stand at CIMT – W3-411 in Hall 3.

The 2013 release of PowerINSPECT offers unique dual-device inspection options that allow measurement with two portable devices at the same time.  PowerINSPECT is believed to be the only inspection software that supports simultaneous operation of different types of device, including laser scanning equipment, from different manufacturers.  Full details are on the Learning Zone at www.delcam.tv/pi2013/lz

Other enhancements in the new version include improved handling of point-cloud data, group editing of probing parameters, graphical editing of boundaries for raster-based inspection, more flexibility in programming dual-column CMMs, and easier measurement and marking out when using PowerINSPECT for clay modelling.

The ability to provide simultaneous measurement from two devices is an extension of the functionality for dual-column CMMs included in the 2012 R2 release of PowerINSPECT.  The main benefit is the same – the ability to reduce inspection times both by measuring a complete object in a single set-up and by taking data simultaneously from two sources.

As with the dual-column mode, the two-device technique works in a similar manner to the single-device version of PowerINSPECT: models are loaded in the same way; inspection items are created using the same methods and so on, meaning that little extra training is required.

Dual-device operation works around the line-of-sight limitations of laser trackers and other optical measuring devices.  The new version of PowerINSPECT enables both sides of the same object to be measured simultaneously with two laser trackers.  This could have huge time savings in any production line as it would minimise the need to reposition the object or measuring device when inspecting all around the component.

PowerINSPECT can also combine measurements from two different types of device.  For example, a laser tracker can be used to check the long-range accuracy of a large component while a portable arm is being used to measure specific critical features in a confined space.

The new dual-device option is related to the dual-column module for CMMs which is also further improved.  In particular, it has been made easier to switch between single-column and dual-column operation, so making it practical to inspect two small items independently with the two columns, as well as to inspect separate areas of a single large object.
PowerINSPECT is firmly established as the world’s leading hardware-independent inspection software.  It combines the ability to work with all types of inspection device with a comprehensive range of inspection routines for taking simple measurements, for inspection of geometric features and for analysing complex 3D surfaces.  The resulting reports present detailed information in an easy-to-read format, that can be understood by all engineers not just inspection specialists.

11 April 2013